The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 31, 2006
Filed:
Feb. 14, 2003
Felix I. Feldchtein, Mayfield Village, OH (US);
Paul G. Amazeen, New Castle, NH (US);
Grigory V. Gelikonov, Nizhny Novgorod, RU;
Valentin M. Gelikonov, Nizhny Novorod, RU;
Felix I. Feldchtein, Mayfield Village, OH (US);
Paul G. Amazeen, New Castle, NH (US);
Grigory V. Gelikonov, Nizhny Novgorod, RU;
Valentin M. Gelikonov, Nizhny Novorod, RU;
Imalux Corporation, Cleveland, OH (US);
Abstract
The present invention relates to the study of internal structure of objects by optical means. The invention presents a bi-directional sampling optical path for the low coherent optical radiation directed to the sample, i.e. a bi-directional sampling arm, and two unidirectional reference beams directed along a reference path designed as a loop. One of the reference beams propagates clockwise and the other propagates counterclockwise in the reference loop. The beam splitters non-reciprocal or polarization-dependent and by placing polarization-changing elements between the beam splitters and/or into the sampling arm and the reference loop. Thus the developed method and optical interferometer make possible to ensure highly efficient use of optical source power together with optimal signal-to-noise ratio for a given optical source power and are simple and cost effective.