The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2006

Filed:

Feb. 05, 2003
Applicants:

Andrew D. Kaplan, Portland, OR (US);

James C. Mansfield, Hillsboro, OR (US);

Douglas C. Mark, Tigard, OR (US);

Inventors:

Andrew D. Kaplan, Portland, OR (US);

James C. Mansfield, Hillsboro, OR (US);

Douglas C. Mark, Tigard, OR (US);

Assignee:

Hinds Instruments, INC, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

The disclosure is directed to systems and methods for precisely measuring birefringence properties of large-format samples of optical elements. A gantry-like configuration is employed for precise movement of birefringence measurement system components relative to the sample. There is also provided an effective large-format sample holder that adequately supports the sample to prevent induced birefringence therein while still presenting a large area of the sample to the unhindered passage of light.


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