The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2006

Filed:

Aug. 04, 2004
Applicants:

Hiroyuki Okuwaki, Ohta-ku, JP;

Osamu Kawazoe, Ohta-ku, JP;

Yasuhiro Naoe, Ohta-ku, JP;

Inventors:

Hiroyuki Okuwaki, Ohta-ku, JP;

Osamu Kawazoe, Ohta-ku, JP;

Yasuhiro Naoe, Ohta-ku, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/14 (2006.01); H01S 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for adjusting a multi-beam source unit including a multi-beam laser diode provided with light emitting points, and a collimator lens includes measuring a state of a position of the light emitting points with respect to a standard design line based on beam spots corresponding to the light emitting points on an image recording surface, and rotating the multi-beam laser diode about an optical axis of a scanning optical system to align the position of the light emitting points with the standard design line.


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