The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 31, 2006

Filed:

Jul. 30, 2003
Applicants:

Toshihiro Sunaga, Tokyo, JP;

Katsumi Kurematsu, Tokyo, JP;

Takayuki Ishii, Tokyo, JP;

Yoshiaki Kurioka, Tokyo, JP;

Sawako Chatani, Port Washington, NY (US);

Inventors:

Toshihiro Sunaga, Tokyo, JP;

Katsumi Kurematsu, Tokyo, JP;

Takayuki Ishii, Tokyo, JP;

Yoshiaki Kurioka, Tokyo, JP;

Sawako Chatani, Port Washington, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03B 21/22 (2006.01); G03B 21/26 (2006.01); G03B 21/28 (2006.01); G02B 27/14 (2006.01); G02B 5/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

A projection optical system having a plurality of reflecting surfaces is disclosed in which a sufficiently large angle is provided between an incident side reference axis and an emerging side reference axis while tilt angles of the respective reflecting surfaces can remain small. The projection optical system projects luminous flux from an image forming element which forms an original image onto a projection surface. The incident side reference axis and the emerging side reference axis of the projection optical system are oblique to each other. The projection optical system has a plurality of reflecting surfaces each having a curvature. The reflecting surfaces are arranged such that the reference axis has at least one intersection in the projection optical system.


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