The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2006
Filed:
Sep. 27, 2001
Jeffrey Soon Beng Sim, Singapore, SG;
Weiloon NG, Singapore, SG;
Aik Chuan Lim, Singapore, SG;
Yongpeng Chng, Singapore, SG;
Kay Hee Tang, Singapore, SG;
Steven Tianchye Cheok, Singapore, SG;
Jeffrey Soon Beng Sim, Singapore, SG;
WeiLoon Ng, Singapore, SG;
Aik Chuan Lim, Singapore, SG;
YongPeng Chng, Singapore, SG;
Kay Hee Tang, Singapore, SG;
Steven TianChye Cheok, Singapore, SG;
Seagate Technology LLC, Scotts Valley, CA (US);
Abstract
In one embodiment of the present invention, systems and methods are provided through which the capacity of a defect buffer in a microcontroller of a mass storage device is determined without regard for the quantity of defects on a recording medium. The capacity of the defect buffer is determined in varying examples, based on the amount of available buffer space and/or the application of the storage device. In one embodiment, the capacity of the defect buffer is less than the quantity of defects on the recording medium, wherein entries in a defect table on the recording medium are swapped in and out of the defect buffer as needed, such as using a most-recently-used scheme. In another embodiment of the present invention, systems and methods are provided through which the defect table is partitioned into a plurality of segments that are physically distributed throughout the recording medium.