The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2006
Filed:
Dec. 08, 2003
Roger T. Clegg, Wichita, KS (US);
Alan T. Pfeifer, Kechi, KS (US);
Bonnie C. Mills, Wichita, KS (US);
Roger T. Clegg, Wichita, KS (US);
Alan T. Pfeifer, Kechi, KS (US);
Bonnie C. Mills, Wichita, KS (US);
LSI Logic Corporation, Milpitas, CA (US);
Abstract
A method and apparatus for generating a system specific test by providing sophisticated error tracking mechanisms to trigger on a specific system event. The present invention addresses the problem of monitoring network traffic and isolating a point of error at the testing stage. The present invention defines a specific system event to be monitored. A trigger is created in the host system and routed to the analyzer, wherein the trigger is used to allow the analyzer to capture information related to the specific system event. When a signal is received at the analyzer, the signal automatically triggers the analyzer to capture and store a predetermined amount of data related to the specific system event before and after the trigger is executed.