The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2006

Filed:

Jan. 22, 2002
Applicants:

Sung-jin Park, Pohang-shi, KR;

Seong-ha Kim, Suwon-shi, KR;

Kwan-woong Song, Seoul, KR;

Inventors:

Sung-Jin Park, Pohang-shi, KR;

Seong-Ha Kim, Suwon-shi, KR;

Kwan-Woong Song, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is provided an optical signal monitoring method and apparatus for measuring the characteristics of an input WDM optical signal. In the optical signal monitoring method, the WDM optical signal is combined with reference lights at both sides of the WDM optical signal on the wavelength spectrum. The combined signal is input to a filter having a variable transmission wavelength according to an applied driving voltage. A driving voltage-light intensity graph of a combined optical signal detected from the filter is derived in its overall wavelength band. A linear approximated wavelength is obtained with respect to a driving voltage and a non-linear compensated wavelength is calculated in a predetermined non-linear compensation formula with the driving voltage and the operation temperature of the filter.


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