The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2006

Filed:

Mar. 01, 2004
Applicants:

Jingfei MA, Waukesha, WI (US);

Guosheng Tan, Waukesha, WI (US);

Inventors:

Jingfei Ma, Waukesha, WI (US);

Guosheng Tan, Waukesha, WI (US);

Assignee:

General Electric Company, Milwaukee, WI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An automatic and adaptive MR data selection technique for use with a multi-receiver coil assembly in an MR imaging device is disclosed. The invention includes acquiring image data from a plurality of receiver coils and determining an index gauge for each of the images. The index gauge is a representation of the position of a given receiver coil within a desired field-of-view (FOV). The index gauges are compared and any image data set having an index gauge demonstrating a less than optimal position of the given receiver coil with respect to the desired FOV is removed based on the index gauges and the comparison. A final image can be reconstructed using the remaining image data sets. The final image is reconstructed from data having overall reduced noise, and therefore reduced artifacts.


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