The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2006

Filed:

Dec. 04, 2002
Applicant:

Richard M. Butler, Fort Collins, CO (US);

Inventor:

Richard M. Butler, Fort Collins, CO (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention includes a method for testing a chip, comprising the steps of measuring power drawn by the chip, calculating a test frequency using the measured power drawn by the chip, and determining performance of the chip at the calculated test frequency. The present invention also includes a system for testing a chip including a first sensor to measure power drawn by the chip, a controller to calculate a test frequency using the measured power drawn by the chip, and a second sensor to measure speed of the chip at the calculated test frequency.


Find Patent Forward Citations

Butler, Richard. (2006). System for and method of assessing chip acceptability and increasing yield (U.S. Patent No. 6989684). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6989684

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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