The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 24, 2006
Filed:
Dec. 04, 2002
Hiroshi Tani, Naka-gun, JP;
Yoko Ogawa, Odawara, JP;
Masanori Inoue, Odawara, JP;
Takaaki Shirakura, Chigasaki, JP;
Koji Sonoda, Naka-gun, JP;
Hiroshi Tani, Naka-gun, JP;
Yoko Ogawa, Odawara, JP;
Masanori Inoue, Odawara, JP;
Takaaki Shirakura, Chigasaki, JP;
Koji Sonoda, Naka-gun, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
To provide an atomic force microscopy which allows the measurement of the configuration of a surface being measured by using the phenomenon observed between the surface being measured and a probe approaching thereto at very fine distance. By selecting the material of the tip surface of said probe such that the surface energy of said probe tip becomes less than the interface energy between the tip surface and the surface being measured, thereby the surface configuration of soft body, or soft fouling adhered to the body surface can be measured. A method of measuring the surface configuration and a method of producing magnetic recording medium using the same are also provided.