The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 24, 2006

Filed:

Mar. 12, 2003
Applicants:

Mohammad M Samii, La Jolla, CA (US);

Mark A. Van Veen, Cardiff by the Sea, CA (US);

Jack H Schmidt, Oceanside, CA (US);

Inventors:

Mohammad M Samii, La Jolla, CA (US);

Mark A. Van Veen, Cardiff by the Sea, CA (US);

Jack H Schmidt, Oceanside, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 3/407 (2006.01);
U.S. Cl.
CPC ...
Abstract

An unbacked transport and conditioning printing system for printing a pattern on a fabric is disclosed. The system includes a fabric characterization and tension control subsystem for gathering information on variations in the fabric and an irregularity detection subsystem for detecting irregularities in the fabric, as well as, crease detection and removal. The fabric passes through a fabric drying and conditioning subsystem for characterization of the fabric. The system also includes a fabric control subsystem for advancing the fabric through a print zone, where a pattern is printed on an unbacked fabric. The fabric is transported through a drying and post-processing subsystem and a closed-loop color control subsystem.


Find Patent Forward Citations

Loading…