The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2006
Filed:
Apr. 09, 2002
Michael Ricchetti, Nashua, NH (US);
Christopher J. Clark, Durham, NH (US);
Michael Ricchetti, Nashua, NH (US);
Christopher J. Clark, Durham, NH (US);
Intellitech Corporation, Durham, NH (US);
Abstract
An architecture that provides stimulus data and verifies the response of multiple electronic circuits substantially in parallel for optimized testing, debugging, or programmable configuration of the circuits. The architecture includes a test bus, a primary test controller connected to the bus, and a plurality of local test controllers connected to the bus, in which each local test controller is coupleable to a respective circuit. The primary test controller sends stimulus data and expected response data over the bus to the respective local test controllers to perform parallel testing, debugging or programmable configuration of the circuits. Each local test controller applies the stimulus data and verifies the circuit response against the expected response data. Further, each local test controller stores the result of the verification for later retrieval by the primary test controller.