The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2006
Filed:
Sep. 13, 2002
Applicant:
Alessandro Paglieri, Bussana di Sanremo, IT;
Inventor:
Alessandro Paglieri, Bussana di Sanremo, IT;
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A test structure is for a circuit () includes a scan configuration module (), including routing circuitry () and control (). The routing circuitry (), under control of control circuitry () can be configured to route scan test signals to various scan core modules () over a selected number of input scan ports SI(N−1:0) and output scan ports SO(N−1:0). Thus, the number of scan ports used can be varied depending upon the tester being used.