The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2006

Filed:

Mar. 13, 2003
Applicants:

Josef Shappir, Mevaseret-Zion, IL;

Amir Sa'ar, Mevaseret-Zion, IL;

Nissim Ben-yosef, Mevaseret-Zion, IL;

Inventors:

Josef Shappir, Mevaseret-Zion, IL;

Amir Sa'ar, Mevaseret-Zion, IL;

Nissim Ben-Yosef, Mevaseret-Zion, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides a silicon wave-guide (), with a silicon oxide cladding () on a silicon substrate (). At predetermined positions along the length of the wave-guide, are created metal oxide semiconductor (MOS) structures. A poly-silicon, or any other conductive layer (), is deposited and patterned above the upper cladding () and electrical contacts are made to the substrate (), the silicon wave-guide (), and the poly-silicon layer (). Upon the application of a potential difference between at least two of the layers from the group comprising the substrate (), the silicon wave-guide (), and the poly-silicon layer (), the free carrier concentration at the top and/or bottom layer of the silicon wave-guide () is changed by the electric field. The change in the electric field results in a change in the index of refraction, and the change in the index of refraction causes a change in the optical mode propagating in the waveguide (). The propagation is controlled by controlling the changes in the electric field, which can be enhanced by localized changes in the optical properties of the wave-guide () induced by ion implantation () or trapping of photo-carriers.


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