The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2006
Filed:
Apr. 25, 2001
Yoshihiro Sasaki, Tokyo, JP;
Masahiko Nagao, Tokyo, JP;
Yoshihiro Sasaki, Tokyo, JP;
Masahiko Nagao, Tokyo, JP;
NEC Electronics Corporation, Kanagawa, JP;
Abstract
An appearance inspection apparatus is composed of a memory, a thread generator and a plurality of CPUsto. The memorystores image data of an appearance of an IC. The thread generator generates a thread in which a procedure is described for independently processing the image data stored in the memoryand storing the processing result into the memory. The plurality of CPUstofor executing the plurality of threads generated by the thread generator, in parallel. Thus, this can provide an appearance inspection apparatus and an appearance inspection method that can execute an appearance inspection at a high speed, irrespectively of a simple configuration.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile