The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2006
Filed:
Nov. 25, 1999
Takafumi Atarashi, Tokyo, JP;
Katsuto Nakatsuka, Sendai-shi, Miyagi 982-0252, JP;
Takafumi Atarashi, Tokyo, JP;
Katsuto Nakatsuka, Sendai-shi, Miyagi 982-0252, JP;
Nittetsu Mining Co., Ltd., Tokyo, JP;
Other;
Abstract
A genuine/counterfeit discrimination method, comprising identifying a combination of at least two of an electric field pattern, a magnetic pattern, an electron beam responsive pattern, and reflection or absorption patterns of visible light, ultraviolet light, and infrared light using an electric field, a magnetic field, an electron beam, visible light, ultraviolet light, or infrared light. A genuine/counterfeit discrimination object, wherein a combination of at least two of an electric field pattern, a magnetic pattern, an electron beam responsive pattern, and reflection or absorption patterns of visible light, ultraviolet light, and infrared light can be identified therein using an electric field, a magnetic field, an electron beam, visible light, ultraviolet light, or infrared light. And a genuine/counterfeit discrimination device comprising at least two devices selected from a device for identifying an electric field pattern, a device for identifying a magnetic pattern, a device for identifying an electron beam responsive pattern, a device for identifying a visible-light pattern, a device for identifying an ultraviolet-light pattern, and a device for identifying an infrared-light pattern and further comprising a device for comparing and identifying patterns obtained with these identification devices.