The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2006
Filed:
Feb. 05, 2004
Hidemi Takayama, Tochigi, JP;
Hidemi Takayama, Tochigi, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Provided is an optical scanning apparatus for optically scanning a surface to be scanned, including: a light source unit that emits a beam modulated according to an image signal; a condenser lens for temporarily focusing the beam emitted from the light source unit into an image in a sub-scanning section in the vicinity of a deflection surface of a light deflector; and a scanning optical system for guiding the beam deflected by the light deflector onto the surface to be scanned, in which: in the sub-scanning section, the beam from the condenser lens is incident at an angle with a normal to the deflection surface; and an scanning optical element constituting the scanning optical system has an optical axis eccentric toward a deflection point side of the deflection surface with respect to a transmission position of a principle ray of the beam in a sub scanning direction.