The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2006
Filed:
Nov. 14, 2001
Apparatus and method for measuring spatially varying bidirectional reflectance distribution function
Kristin J. Dana, Staten Island, NY (US);
Kristin J. Dana, Staten Island, NY (US);
Rutgers, The State University of New Jersey, New Brunswick, NJ (US);
Abstract
An apparatus and method for measuring spatially varying bidirectional reflectance distribution function and method are provided. The apparatus and method provide means to illuminate different areas of a sample at different angles of incidence and detect the angular variation of radiation emitted from the sample in response to the illumination. The apparatus includes a paraboloidal reflector for delivering the illumination and receiving the radiation emitted by the sample, a radiation source for generating a beam of collimated radiation, a beam steering device for controlling the angle of incidence with which the focused cone of light strikes the sample, and a detector to receive the collected light from the reflector.