The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2006
Filed:
Apr. 24, 2002
Yakov Reznichenko, Newton, MA (US);
Aaron Lowenberger, Brookline, MA (US);
Yakov Reznichenko, Newton, MA (US);
Aaron Lowenberger, Brookline, MA (US);
Analog Devices, Inc., Norwood, MA (US);
Abstract
A system and apparatus for testing a micromachined optical device includes a computerized test station that generates signals to control the micromachined optical device as well as various test equipment and analyzes signals generated by the micromachined optical device and various test equipment. The computerized test station typically provides for both manual and automated testing of the micromachined optical device. In order to test the micromachined optical device, various optical measurement devices are typically mounted on a frame. The frame is configured so as to maintain proper alignment between the optical measurement devices and the micromachined device under test. The frame is mounted to or integral with a focusing device. The frame moves along with focusing movements of the focusing device in such a way that the optical measurement devices are properly aligned with the micromachined device under test when the focusing device is focused on the micromachined device under test.