The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2006

Filed:

Dec. 30, 1999
Applicants:

Masahiro Nakata, Tokyo, JP;

Shigeru Iwamoto, Tokyo, JP;

Inventors:

Masahiro Nakata, Tokyo, JP;

Shigeru Iwamoto, Tokyo, JP;

Assignee:

PENTAX Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); G03B 13/08 (2006.01); G01J 1/42 (2006.01); G02B 27/40 (2006.01); H01L 29/76 (2006.01);
U.S. Cl.
CPC ...
Abstract

In a multipoint autofocus system in which a focus state of objects at different positions in a plurality of focus detection zones in an image surface is detected, and thereafter, one of pieces of information on the focus state thus detected is selected, so that a focusing optical system is moved in accordance with the selected focus data, provision is made of a judging apparatus for judging the contrast of the detected object in the focus detection zones, and a controller for selecting data representing the shortest focus from among the focus data of the objects in the focus detection zones in which the judged object contrast is higher than a predetermined value.


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