The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2006

Filed:

Feb. 28, 2001
Applicants:

Kai Chang, College Station, TX (US);

Tae-yeoul Yun, College Station, TX (US);

Raghbir S. Tahim, Burna Park, CA (US);

Inventors:

Kai Chang, College Station, TX (US);

Tae-Yeoul Yun, College Station, TX (US);

Raghbir S. Tahim, Burna Park, CA (US);

Assignees:

The Texas A&M University System, College Station, TX (US);

RST Scientific Research, Inc., Anaheim, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01Q 13/08 (2006.01); H01P 1/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for introducing electromagnetic perturbation into a target device includes a piezoelectric transducer configured to deflect in response to an applied voltage and a perturber configured to deflect in response to deflection of the piezoelectric transducer. The deflection of the perturber causes electromagnetic perturbation, and in some cases a phase shift, in the target device. The electromagnetic perturbation may also be used to tune microwave devices such as filters, resonators, and oscillators.


Find Patent Forward Citations

Loading…