The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 17, 2006
Filed:
Feb. 07, 2003
Roger Guevremont, Ottawa, CA;
Roger Guevremont, Ottawa, CA;
Ionalytics Corporation, Ottawa, CA;
Abstract
Disclosed is a method and apparatus for detecting trace levels of a vapour in a carrier gas stream. A method according to the instant invention comprises the steps of providing a flow of a carrier gas through an analyzer region of a high field asymmetric waveform ion mobility spectrometer (), the carrier gas including a first gas and a trace amount of a vapour. At least a first type of indicator ions are introduced into the analyzer region, and a compensation voltage for transmitting the at least a first type of indicator ions through the analyzer region, in the presence of the flow of a carrier gas and at a given asymmetric waveform voltage, is determined. The determined compensation voltage is compared to calibration data relating to a compensation voltage for transmitting the at least a first type of indicator ions through the analyzer region at the given asymmetric waveform voltage in the presence of each of a plurality of different known trace amounts of the vapour mixed with the first gas. In this way, an amount of the vapour in the carrier gas is determined, absent a step of ionizing a substantial portion of the vapour.