The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 17, 2006

Filed:

Apr. 01, 2002
Applicants:

Buena Chui, Chandler, AZ (US);

Robert Elghanian, Skokie, IL (US);

Vineet Gupta, Reading, MA (US);

Krishnamurthy Jayaraman, Hoffman Estates, IL (US);

Gretchen Kiser, Mesa, AZ (US);

Changming LI, Schaumburg, AZ (US);

Chang-gong Liu, Cherry Hill, NJ (US);

Kenneth R. Luehrsen, Half Moon Bay, CA (US);

Abhijit Mazumder, Buffalo Grove, IL (US);

Ramesh Ramakrishnan, Vernon Hills, IL (US);

Arkadiy Silbergleyt, Chandler, AZ (US);

Todd Tuggle, Oceanside, CA (US);

Carl Yamashiro, Chandler, AZ (US);

Handy Yowanto, Walnut, CA (US);

Ekaterina Pestova, Downers Grove, IL (US);

David R. Fermin, Minneapolis, MN (US);

David G. Wang, Deerfield, IL (US);

Zhijie John Gu, San Diego, CA (US);

Inventors:

Buena Chui, Chandler, AZ (US);

Robert Elghanian, Skokie, IL (US);

Vineet Gupta, Reading, MA (US);

Krishnamurthy Jayaraman, Hoffman Estates, IL (US);

Gretchen Kiser, Mesa, AZ (US);

Changming Li, Schaumburg, AZ (US);

Chang-Gong Liu, Cherry Hill, NJ (US);

Kenneth R. Luehrsen, Half Moon Bay, CA (US);

Abhijit Mazumder, Buffalo Grove, IL (US);

Ramesh Ramakrishnan, Vernon Hills, IL (US);

Arkadiy Silbergleyt, Chandler, AZ (US);

Todd Tuggle, Oceanside, CA (US);

Carl Yamashiro, Chandler, AZ (US);

Handy Yowanto, Walnut, CA (US);

Ekaterina Pestova, Downers Grove, IL (US);

David R. Fermin, Minneapolis, MN (US);

David G. Wang, Deerfield, IL (US);

Zhijie John Gu, San Diego, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention relates to methods and compositions for determining single nucleotide polymorphisms (SNPs) in P450 genes. In preferred embodiments, self extension of interrogation probes is prevented by using novel non self-extension probes and/or methods, thereby improving the specificity and efficiency of P450 SNP detection in target samples with minimal false positive results. The invention thus describes a variety of methods to decrease self-extension of interrogation probes. In addition, this invention provides a unique collection of P450 SNP probes on one assay, primer sequences for specific amplification of each of the seven P450 genes and amplicon control probes to evaluate whether the intended p450 gene targets were amplified successfully. The invention also describes a variety of array platforms for performing the assays of the invention; for example: CodeLink™, eSensor™, multiplex arrays with cartridges etc., all described herein.


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