The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2006

Filed:

Aug. 07, 2002
Applicants:

Kenneth P. Rodbell, Sandy Hook, CT (US);

Henry H. K. Tang, Poughkeepsie, NY (US);

Robert M. Trepp, Mahopac, NY (US);

Robert Chi-foon Wong, Poughkeepsie, NY (US);

Inventors:

Kenneth P. Rodbell, Sandy Hook, CT (US);

Henry H. K. Tang, Poughkeepsie, NY (US);

Robert M. Trepp, Mahopac, NY (US);

Robert Chi-Foon Wong, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for mitigating the impact of radiation induced in a data processor incorporating integrated circuits. The method comprises the steps of determining the location of the data processor, determining a set of radiation sources and intensities at that location, and estimating the soft error rate of the data processor as a function of the determined radiation intensities and geometric characteristics of said integrated circuits to provide an estimate value. The data processor is modified (either hardware or software) in response to the estimate value at times the estimate value exceeds a predetermined value.


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