The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2006
Filed:
Nov. 06, 2002
Dae-sung Lee, Seoul, KR;
Jae-cheol Lee, Yongin, KR;
Gook-tae Son, Yongin, KR;
Jung-hee Kim, Seoul, KR;
Dae-sung Lee, Seoul, KR;
Jae-cheol Lee, Yongin, KR;
Gook-tae Son, Yongin, KR;
Jung-hee Kim, Seoul, KR;
Samsung Electronics Co., Ltd., Kyungki-do, KR;
Abstract
A method of calculating a probability of failures caused only by defects, a method of calculating a defect limited yield using the classification of pattern parameters extracted only from the defects, and a system for calculating the probability of failure and the defect limited yield are provided. In one exemplary embodiment for calculating a probability of failures caused only by defects, defects are detected in inspected blocks that have defects and in blocks located around the inspected blocks to measure the number of inspected blocks that have failures caused by reasons other than the defects in the blocks located around the inspected blocks having defects (n), the number of inspected blocks having no failures in the blocks located around the inspected blocks having the defects (n), the number of inspected blocks having failures caused by defects in the inspected blocks having defects (n), and the number of inspected blocks having no failures in the inspected blocks having defects (n). The data (n) through (n) is then substituted in the following formula:whereand