The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2006
Filed:
Oct. 29, 2003
Alex Fishman, Sunnyvale, CA (US);
Serguei Dorofeev, Sunnyvale, CA (US);
Dmitri Bannikov, Mountain View, CA (US);
Robert Lee Fennelly, San Jose, CA (US);
Andreas Weber, Los Altos, CA (US);
Subra Nagarajan, Livermore, CA (US);
Alex Fishman, Sunnyvale, CA (US);
Serguei Dorofeev, Sunnyvale, CA (US);
Dmitri Bannikov, Mountain View, CA (US);
Robert Lee Fennelly, San Jose, CA (US);
Andreas Weber, Los Altos, CA (US);
Subra Nagarajan, Livermore, CA (US);
Finisar Corporation, Sunnyvale, CA (US);
Abstract
A system and method for testing the jitter tolerance and signal attenuation tolerance of an optoelectronic device is disclosed. The system includes a generation circuit, delay circuit and comparison circuitry. A first sequence of bits is generated, delayed, and sent to the optoelectronic device. The optoelectronic device receives the bits and retransmits them as a second sequence to the comparison circuitry, which compares the two bit sequences to determine a bit error rate. The bit error rate is then used to determine the jitter tolerance and, in an alternate embodiment, the signal attenuation tolerance of the optoelectronic device being tested.