The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2006

Filed:

Mar. 19, 2004
Applicant:

Leesa M. Noujeim, Sunnyvale, CA (US);

Inventor:

Leesa M. Noujeim, Sunnyvale, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for analyzing input output (I/O) pin arrangements to determine the effect of differential pair and power and ground pin placement on signal quality which includes constructing an array of pins, arranging a plurality of differential pairs within the array of pins to provide a pin arrangement, exciting each of the differential pairs within the pin arrangement, monitoring coupled noise on other differential pairs within the pin arrangement, and analyzing the pin arrangement based upon the monitoring.


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