The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6985629 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 10, 2006

Filed:

Apr. 25, 2001
Applicant:

Hiroyasu Takahashi, Kanagawa, JP;

Inventor:

Hiroyasu Takahashi, Kanagawa, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

To cut out a character and the like which are relatively darker than a background and are written with a pen and so on at a high speed, to use the cutting-out of a character and the like as pre-processing for character recognition, and to emphasize an object so as to hardly damage determinability of a character, a figure and the like to binarize the same. Attention is paid to that a character written with a pen and so on is relatively darker than a background, and a relative density of the character to a periphery thereof is obtained to binarize the same, thus emphasizing an object such as a character.


Find Patent Forward Citations

Takahashi, Hiroyasu. (2006). Image processing method, relative density detecting method and image processing apparatus (U.S. Patent No. 6985629). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6985629

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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