The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2006
Filed:
May. 09, 2001
Ying EE Yip, Singapore, SG;
Aik Chuan Lim, Singapore, SG;
Yong Peng Chng, Singapore, SG;
Steven Tianchye Cheok, Singapore, SG;
Wei Loon NG, Singapore, SG;
Ying Ee Yip, Singapore, SG;
Aik Chuan Lim, Singapore, SG;
Yong Peng Chng, Singapore, SG;
Steven TianChye Cheok, Singapore, SG;
Wei Loon Ng, Singapore, SG;
Seagate Technology LLC, Scotts Valley, CA (US);
Abstract
The present invention provides a method of describing defects that requires less memory space than conventional methods. Entries of a first defect table are sorted according to the type of track layout, or zones. They are then grouped into clusters. Each cluster is characterized by a set of new parameters, including a starting sector, a scratch parameter, a span parameter, and an angle parameter. The new parameters are stored in a second table, replacing the corresponding entries in the first table. In this manner, a single entry in the second table replaces one or more entries in the first table with one entry in the first table.