The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2006

Filed:

Aug. 30, 2002
Applicants:

Yufei Bao, Roswell, GA (US);

Ion Dimitriu, Atlanta, GA (US);

Kevin Hsu, Roswell, GA (US);

Jeffrey W. Miller, Legal Representative, Kennesaw, GA (US);

Inventors:

Yufei Bao, Roswell, GA (US);

Ion Dimitriu, Atlanta, GA (US);

Kevin Hsu, Roswell, GA (US);

Jeffrey W. Miller, legal representative, Kennesaw, GA (US);

Assignee:

Micron Optics, Inc., Atlanta, GA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to Fabry-Perot interferometers (FFPI) comprising two or more optically coupled tunable all-fiber Fabry-Perot component filters, wherein the Fabry-Perot cavity of the filter is formed within a bare section of optical fiber held within a fiber ferrule. The wavelength transmitted by the interferometer can be tuned thermally or electromechanically for a fiber containing the Fabry-Perot cavity bonded into a groove of a metal substrate. The interferometer can be tuned by changing the length of Fabry-Perot cavity, including by the use of a piezoelectric transducer.


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