The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2006

Filed:

May. 22, 2003
Applicants:

Martin Bechem, Wuppertal, DE;

Wolfgang Paffhausen, Leverkusen, DE;

Inventors:

Martin Bechem, Wuppertal, DE;

Wolfgang Paffhausen, Leverkusen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a fluorescence-measuring system as can be employed for high-throughput screening in drug development. The arrangement for fluorescence excitation contains a two-dimensionally extended sample-receiving device and at least two illumination sources for exciting the fluorescence of the samples. The illumination sources are extended linearly and arranged in such a way that the illuminated area of the sample-receiving device is homogeneously illuminated directly or via deflecting mirrors at an opening angle of ≦30°. A detector system for the fluorescence light from the sample-receiving device is arranged on either side of the sample-receiving device in such a way that it detects fluorescence emission from the area of measurement at an angle outside the range of reflection of the excitation light of the illumination sources at the illuminated area of the sample-receiving device, preferably at an angle in the range from 80° to 100°, particularly preferably about 90°, to the extended plane of the area of the sample-receiving device.


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