The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2006
Filed:
Feb. 23, 2001
Frank E. Semersky, Toledo, OH (US);
Dennis T. Sturgill, Perrysburg, OH (US);
Frank E. Semersky, Toledo, OH (US);
Dennis T. Sturgill, Perrysburg, OH (US);
Petwall, LLC, Holland, OH (US);
Abstract
A method for measuring the wall thickness of plastic containers () during a container manufacturing process includes providing a plastic container (), the plastic container () having a longitudinal axis and at least two side walls spaced radially from the longitudinal axis. The side walls are formed of a material that absorbs light energy in a predetermined molecular absorption band. Light energy is then directed from a source unit () through the at least two side walls of the plastic container () in a plane transverse to the longitudinal axis of the plastic container (). A portion of the light energy that passes through the sidewalls of the container () is sensed by a sensor (), and a signal representing a thickness of the sidewalls of the plastic container is generated from the sensed portion of the energy by a computer ().