The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 10, 2006

Filed:

Nov. 13, 2002
Applicants:

Tadashi Kuroiwa, Tokyo, JP;

Kenichi Ijima, Tokyo, JP;

Nobutaka Kobayashi, Tokyo, JP;

Inventors:

Tadashi Kuroiwa, Tokyo, JP;

Kenichi Ijima, Tokyo, JP;

Nobutaka Kobayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B23K 26/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A laser material processing apparatus for processing a workpiece () in such a way as to separate one laser light () into two laser beams () via first polarizer (), one laser beam being passed via the mirrors (), the other laser beam being scanned biaxially by a first galvano scanner (), and conduct two laser beams () to a second polarizer () for scanning via a second galvano scanner (), wherein an optical path is constituted such that the laser beam () transmitted through the first polarizer () is reflected by the second polarizer (), and the laser beam () reflected by the first polarizer () is transmitted through the second polarizer ().


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