The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 10, 2006
Filed:
Oct. 02, 1997
Chun-ming Chen, Falmouth, ME (US);
Charles R. Carpenter, Scarborough, ME (US);
Haoyi Gu, Portland, ME (US);
Ali Naqui, Falmouth, ME (US);
Chun-Ming Chen, Falmouth, ME (US);
Charles R. Carpenter, Scarborough, ME (US);
Haoyi Gu, Portland, ME (US);
Ali Naqui, Falmouth, ME (US);
IDEXX Laboratories, Inc., Westbrook, ME (US);
Abstract
The present invention relates to a method of detecting the presence of target microorganisms in a biological sample and of simultaneously determining the susceptibility of the microorganisms to antimicrobial agents. The target microbial organisms may be urinary pathogens. The methods include the steps of providing a multicompartment assay device with at least one compartment containing a medium capable of sustaining the growth of total viable microorganisms, at least one compartment containing a medium capable of sustaining the growth of target microorganisms, and at least one compartment containing an antimicrobial susceptibility interpretation medium. A biological sample is placed in each compartment and the presence and antimicrobial susceptibility of the target microorganisms which may be present is determined by analyzing which compartments exhibit microbial growth.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile