The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2006

Filed:

Nov. 21, 2001
Applicants:

Yumiko Seki, Toyonaka, JP;

Shinkichi Ebata, Samukawa, JP;

Inventors:

Yumiko Seki, Toyonaka, JP;

Shinkichi Ebata, Samukawa, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 12/00 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Even when a user does not know a structure of a computer readable program, a technique capable of analyzing log information is provided. A log analyzing method for analyzing log information outputted when a program is executed by a computer is comprised of: a step for acquiring log information outputted when a program is executed to thereby read the acquired log information; a step for accepting a user designation condition indicative of log information which is extracted; a step for extracting information from the log information based upon the accepted user designation condition, and for judging as to whether or not each of operations while the program is executed can satisfy an initial condition thereof so as to analyze a cause of an error occurred while the program is executed; and a step for providing a result of the error cause analysis to a user.


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