The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2006

Filed:

Apr. 29, 2003
Applicant:

William C. Schuh, Delavan, WI (US);

Inventor:

William C. Schuh, Delavan, WI (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method is presented for detecting the degradation of a thermocouple circuit prior to failure and the prediction of certain impending thermocouple failures. The detection system monitors the loop resistance of the measurement circuit and isolates the heat affected loop resistance changes from the degraded circuit changes. The monitoring circuit is divided into a sheathed portion, generally exposed to the temperature measurement, and an unsheathed portion of the monitoring system generally at ambient temperature. An algorithm is provided for standard instrumentation systems to predict certain types of impending failure in thermocouple temperature measurement circuits. The algorithm essentially compensates the loop resistance measurements by removing the heat affected sheathed portion loop resistance changes computed from the initial unsheathed portion resistance based on manufacturers parameters specific to a thermocouple and an initial loop resistance measurement, leaving only those changes due to degradations in the unsheathed portion of the circuit.


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