The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2006

Filed:

Dec. 18, 2003
Applicants:

Thanh V. Lam, Poughkeepsie, NY (US);

Giampaolo Lauria, Wappingers Falls, NY (US);

Inventors:

Thanh V. Lam, Poughkeepsie, NY (US);

Giampaolo Lauria, Wappingers Falls, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test automation tool is provided which is operable to integrate a set of dynamic attributes and values into tests to be performed on a computing environment. The test automation tool includes a job submission engine (JSE) operable to receive input regarding first attributes unchanged from a first computing environment and second attributes representing change from the first computing environment. A job control file generator (JCFG) is provided in electronic communication with the job submission engine and is operable to automatically generate job control files (JCFs) for controlling testing of the computing environment according to attribute values including first attribute values and second attribute values. First attribute values are generated based on an automatic sampling of values of first attributes. The JSE is further operable to automatically submit the JCFs to the computing environment for execution and to automatically monitor execution according to the JCFs.


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