The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2006
Filed:
Dec. 28, 2001
Yusuf Akgul, Northboro, MA (US);
Ivan Bachelder, Newton, MA (US);
Prabhav Morje, Natick, MA (US);
Juha Koljonen, Needham, MA (US);
Jason Davis, Bellingham, MA (US);
Yusuf Akgul, Northboro, MA (US);
Ivan Bachelder, Newton, MA (US);
Prabhav Morje, Natick, MA (US);
Juha Koljonen, Needham, MA (US);
Jason Davis, Bellingham, MA (US);
Cognex Technology and Investment Corporation, Mt. View, CA (US);
Abstract
A method of analyzing machine vision images to identify low contrast features such as scratches or cracks on the polished ends of optical fibers. A bank of oriented filters having incremental angles of orientation are tuned to respond to the frequency characteristics of oriented scratches or cracks having an approximate width. The filters are applied to an image to generate a filter response image for each filter orientation. The set of filter response images are combined to form a single data set indicating a magnitude and angle for each pixel in the original image. Elements of the combined data set having corresponding angles and magnitudes are grouped to form contour components that can be optionally input to higher order processes.