The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2006
Filed:
Sep. 24, 2003
John Scott Price, Wauwatosa, WI (US);
Wayne Frederick Block, Sussex, WI (US);
Mark Vermilyea, Niskayuna, NY (US);
John Scott Price, Wauwatosa, WI (US);
Wayne Frederick Block, Sussex, WI (US);
Mark Vermilyea, Niskayuna, NY (US);
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
Systems and methods for obtaining multi-slice images having a total thickness of up to about 160 mm or more in a single gantry rotation in computed tomography or volume computed tomography are described. One embodiment comprises an extended, multi-spot x-ray source for computed tomography or volume computed tomography imaging, comprising: an electron gun capable of producing a plurality of electron beams, each electron beam focused at a predetermined distance and aimed in a predetermined direction; and a plurality of targets positioned to receive the electron beams and generate x-rays in response thereto, each target comprising a predetermined focal spot thereon, wherein each electron beam is synchronized to strike, at an appropriate time, a predetermined target comprising a predetermined focal spot thereon.