The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2006
Filed:
Nov. 25, 2003
Applicant:
Gerhard Pfeifer, Solms, DE;
Inventor:
Gerhard Pfeifer, Solms, DE;
Assignee:
Leica Microsystems Wetzlar GmbH, Wetzlar, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The invention discloses a microscope () whose stand () comprises a transverse main section (), a stand column section, and a stand base section (). The stand () receives an element () that is rotatable about an axis and carries several optical elements (). A flap () through which the rotatable element () is accessible is provided on the stand. The flap () coacts with a preloaded bolt element () in such a way that when the flap () is open, the bolt element () locks the rotatable element ().