The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2006
Filed:
Mar. 16, 2004
Applicants:
Takayuki Kei, Musashino, JP;
Kenji Hachiya, Musashino, JP;
Kenta Mikuriya, Musashino, JP;
Inventors:
Assignee:
Yokogawa Electric Corporation, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
The present invention is characterized in that it is possible to provide a three-dimensional confocal microscope system configured so that an objective lens can be scanned in the optical-axis direction using an actuator to obtain sliced confocal images of a sample, wherein the actuator is driven using a scanning waveform signal, which is triangular or step-like and has been corrected so that acceleration is kept virtually constant at discontinuous points of change in the scanning waveform signal, thereby consistently providing sliced confocal images of the sample.