The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 03, 2006
Filed:
Apr. 02, 2004
Thomas L. Obert, Pomona, CA (US);
Kenneth W. Brown, Yucaipa, CA (US);
Alan A. Rattray, Alta Loma, CA (US);
John Gerstenberg, Lake Elsinore, CA (US);
James R. Gallivan, Pomona, CA (US);
Thomas L. Obert, Pomona, CA (US);
Kenneth W. Brown, Yucaipa, CA (US);
Alan A. Rattray, Alta Loma, CA (US);
John Gerstenberg, Lake Elsinore, CA (US);
James R. Gallivan, Pomona, CA (US);
Raytheon Company, Waltham, MA (US);
Abstract
An apparatus includes a microwave source that produces a microwave feed beam, and a first pair of microwave sensors that each intercept and receive a portion of the microwave feed beam. The two microwave sensors are spaced apart from each other along a first-pair axis. A first phase-comparison device has as it inputs the output signals of the two microwave sensors, and as an output a first phase comparison of the first-sensor output signal and the second-sensor output signal. A first geometrical calculator has as an input the first phase comparison and as an output a geometrical relationship of the first-pair axis to an other feature. This geometrical relationship output may be used to generate a control signal that is used to alter the geometrical relationship. There may be additional microwave sensors operating in a similar manner but spaced to provide information for other geometrical axes or allow improvements in geometrical measurements.