The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2006

Filed:

Sep. 30, 2003
Applicants:

Armin W. Doerry, Albuquerque, NM (US);

Brian P. Mileshosky, Albuquerque, NM (US);

Douglas L. Bickel, Albuquerque, NM (US);

Inventors:

Armin W. Doerry, Albuquerque, NM (US);

Brian P. Mileshosky, Albuquerque, NM (US);

Douglas L. Bickel, Albuquerque, NM (US);

Assignee:

Sandia Corporation, Albuquerque, NM (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/524 (2006.01);
U.S. Cl.
CPC ...
Abstract

Radar systems use time delay measurements between a transmitted signal and its echo to calculate range to a target. Ranges that change with time cause a Doppler offset in phase and frequency of the echo. Consequently, the closing velocity between target and radar can be measured by measuring the Doppler offset of the echo. The closing velocity is also known as radial velocity, or line-of-sight velocity. Doppler frequency is measured in a pulse-Doppler radar as a linear phase shift over a set of radar pulses during some Coherent Processing Interval (CPI). An Interferometric Moving Target Indicator (MTI) radar can be used to measure the tangential velocity component of a moving target. Multiple baselines, along with the conventional radial velocity measurement, allow estimating the true 3-D velocity of a target.


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