The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2006

Filed:

May. 27, 2004
Applicant:

Jonathan B. Scott, Santa Rosa, CA (US);

Inventor:

Jonathan B. Scott, Santa Rosa, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/04 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A calibration system and method determines magnitudes of traveling-waves at a non-coaxial plane of a scattering (S) parameter measurement device that includes an adapter link between the non-coaxial plane and a coaxial plane. A calibration is conducted at an interface between the adapter link and the coaxial plane to derive coaxial error terms for the S-parameter measurement device. In addition, a power meter measurement is conducted at the coaxial plane to obtain power wave measurements using the coaxial error terms. A calibration is also conducted at an interface between the adapter link and the non-coaxial plane to derive non-coaxial error terms for the S-parameter measurement device. The power wave measurements, coaxial error terms and non-coaxial error terms are used to calculate the magnitude of one of the traveling-waves at the non-coaxial plane.


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