The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 03, 2006

Filed:

Aug. 13, 2002
Applicants:

Douglas N. Modlin, Palo Alto, CA (US);

Glenn R. Edwards, Palo Alto, CA (US);

John C. Owicki, Palo Alto, CA (US);

Michael T. Taylor, Newark, CA (US);

Samuel A. Marquiss, Santa Clara, CA (US);

Inventors:

Douglas N. Modlin, Palo Alto, CA (US);

Glenn R. Edwards, Palo Alto, CA (US);

John C. Owicki, Palo Alto, CA (US);

Michael T. Taylor, Newark, CA (US);

Samuel A. Marquiss, Santa Clara, CA (US);

Assignee:

Molecular Devices Corporation, Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 15/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems, and components thereof, for analyzing samples. These systems include apparatus and methods for generating, transmitting, detecting, and/or analyzing light, including without limitation high-throughput optical screening devices for analyzing samples at one or more assay sites. These systems also include apparatus and methods for supporting samples for analysis, including without limitation multiwell sample holders such as microplates.


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