The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6981188 B1

PDF
Full Text
Expired
Date of Patent:
Dec. 27, 2005

Filed:

Aug. 16, 2001
Applicants:

Ori Galzur, Modiin, IL;

Tamas Toth, Moshav Ometz, IL;

Inventors:

Ori Galzur, Modiin, IL;

Tamas Toth, Moshav Ometz, IL;

Assignee:

Tower Semiconductor Ltd., Migdal Haemek, IL;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C029/00 ;
U.S. Cl.
CPC ...
Abstract

Self-test instructions are loaded from a tester into a configuration array of a memory device, and then a control circuit of the memory device sequentially reads and executes the self-test instructions while the tester is in an idle state. Data patterns are written to a main memory array of the memory device the internal self-test process. The control circuit includes a comparator for detecting defective memory cells by comparing data values read from the main array with the data pattern previously written into the main memory array. A BIN counter identifies the currently-executed self-test instruction, and is read and transmitted to the tester when an error is detected.


Find Patent Forward Citations

Galzur, Ori. (2005). Non-volatile memory device with self test (U.S. Patent No. 6981188). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6981188

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