The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2005
Filed:
Nov. 15, 2001
Charlotte Anne Reed, Underhill, VT (US);
John Sargis, Jr., Round Rock, TX (US);
Charlotte Anne Reed, Underhill, VT (US);
John Sargis, Jr., Round Rock, TX (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
For testing a logic unit under test (UUT), rule-based random irritation of a UUT model is provided to be used in conjunction with a simulator. The UUT model is stimulated (or irritated) with data patterns randomly generated by a pattern generator within the boundary of limitations imposed by a rules list. The rules list provides restrictions or encouragements on how data patterns are to be applied to the software model of the UUT. The pattern generator may be implemented either within or outside the simulator. If the pattern generator is incorporated into the simulator, then a software environment is required to interface communications between the pattern generator, the simulator, and other software entities involved in the simulation.