The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 27, 2005
Filed:
Dec. 18, 2002
Applicants:
Takeshi Kobayashi, Nagoya, JP;
Hiroyuki Honda, Nagoya, JP;
Taizo Hanai, Fukuoka, JP;
Tatsuya Ando, Nagoya, JP;
Inventors:
Takeshi Kobayashi, Nagoya, JP;
Hiroyuki Honda, Nagoya, JP;
Taizo Hanai, Fukuoka, JP;
Tatsuya Ando, Nagoya, JP;
Assignee:
Nagoya Industrial Science Research Institute, Nagoya, JP;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N033/48 ; G06G007/48 ; G06F015/18 ; G06E001/00 ; G06E003/00 ;
U.S. Cl.
CPC ...
Abstract
The expression data of specimen genes are processed using the SWEEP operator method and the parameter increasing method, and genes are selected. A FNN model is constructed by making the expression data of the selected genes as input variables.