The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2005

Filed:

Oct. 06, 2003
Applicant:

Francis J. O'brien, Jr., Newport, RI (US);

Inventor:

Francis J. O'Brien, Jr., Newport, RI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F017/00 ;
U.S. Cl.
CPC ...
Abstract

A two-stage method is provided for automatically characterizing the spatial arrangement among data points of a three-dimensional time series distribution in a data processing system wherein the classification of this time series distribution is required. The invention utilizes two-stage method Cartesian grids to determine (1) the number of cubes in the grids containing at least one input data point of the time series distribution; (2) the expected number of cubes which would contain at least one data point in a statistically determined random distribution in these grids; and (3) an upper and lower probability of false alarm above and below this expected value utilizing a second discrete probability relationship in order to analyze the randomness characteristic of the input time series distribution.


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