The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 27, 2005

Filed:

Jan. 12, 2004
Applicant:

Peter J. Wilk, New York, NY (US);

Inventor:

Peter J. Wilk, New York, NY (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K009/00 ;
U.S. Cl.
CPC ...
Abstract

A method for investigating structural integrity utilizes a carrier member having a flexible surface and a plurality of electromechanical transducer elements attached to the carrier member, the transducer elements being spaced from each other along at least two spatial dimensions. The method includes conforming the flexible surface to a solid structural member, so that a substantial portion of the flexible member is in effective wave-transmitting engagement with the structural member, thereafter transmitting pressure waves from at least one of the transducer elements into the structural member, receiving pressure waves reflected from an internal structural defect in the structural member in response to the pressure waves transmitted from the one of the transducer elements, and analyzing the received pressure waves so as to detect the structural defect.


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